AFM: a valid reference tool?

Herschel M. Marchman; Nichole Dunham

doi:10.1117/12.308718

8 June 1998 AFM: a valid reference tool?

Herschel M. Marchman, Nichole Dunham

Proceedings Volume 3332, Metrology, Inspection, and Process Control for Microlithography XII; (1998) https://doi.org/10.1117/12.308718
Event: 23rd Annual International Symposium on Microlithography, 1998, Santa Clara, CA, United States

Abstract

To first order, the use of AFM as a reference tool potentially offers a large improvement over pre'ious techniques for matching and calibration of on-line CL)-SEMs. However, the utility of this approach depends on the validity of the assumption that AFM precision and accuracy are relatively constant with sample type. A fullfactorial design using analysis of variations (ANOVA) has been employed in order to gauge the precision of a non-contact mode CD AFM over multiple sample types and instrument conditions. 'The effects of material layer, pattern geometry, feature shape, and tip size on AFM precision viill he presented.

Citation Download Citation

Herschel M. Marchman and Nichole Dunham "AFM: a valid reference tool?", Proc. SPIE 3332, Metrology, Inspection, and Process Control for Microlithography XII, (8 June 1998); https://doi.org/10.1117/12.308718

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