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Proceedings Article

X-ray scattering signatures for material identification

[+] Author Affiliations
Robert D. Speller

Univ. College London (United Kingdom)

Julie A. Horrocks

St. Bartholomew's Hospital (United Kingdom)

Richard J. Lacey

Police Science Development Branch (United Kingdom)

Proc. SPIE 2092, Substance Detection Systems, 366 (March 28, 1994); doi:10.1117/12.171256
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From Conference Volume 2092

  • Substance Detection Systems
  • Geoffrey L. Harding; Richard C. Lanza; Lawrence J. Myers; Peter A. Young
  • Innsbruck, Austria | October 03, 1993

abstract

X-ray scattering at low angles demonstrates diffraction effects that can be used to characterize materials. The effects of overlying material are shown not to affect the usefulness of the data for the identification of explosives. The important features in the scattering signature are identified.

© (1994) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Robert D. Speller ; Julie A. Horrocks and Richard J. Lacey
"X-ray scattering signatures for material identification", Proc. SPIE 2092, Substance Detection Systems, 366 (March 28, 1994); doi:10.1117/12.171256; http://dx.doi.org/10.1117/12.171256


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