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Proceedings Article

Grisms from germanium/silicon for astronomical instruments

[+] Author Affiliations
Hans-Ulrich Kaeufl

European Southern Observatory (Germany)

Karl Kuehl, Steffan Vogel

Fraunhofer Institut fuer Festkoerpertechnologie (Germany)

Proc. SPIE 3354, Infrared Astronomical Instrumentation, 151 (August 21, 1998); doi:10.1117/12.317257
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From Conference Volume 3354

  • Infrared Astronomical Instrumentation
  • Albert M. Fowler
  • Kona, HI | March 20, 1998

abstract

An overview on the use of grisms from high refractive index optical materials is given. When using grisms manufactured from silicon or germanium two IR focal-reducers of the European Southern Observatory (ESO) can serve as medium resolution echelle spectrometers. A silicon echelle grism allowing for a spectral resolution of 5000 for a 1 arcsec slit is being developed for SOFI, a near IR instrument featuring a 1024 Rockwell HgCdTe detector at ESO's 3.5m New Technology Telescope. For TIMMI2, ESO's new 10/20 micrometers instrument for the 3.6m telescope a germanium echelle grism is being built. For TIMMI a 10 micrometers camera featuring a 64 X 64 detector a low resolution germanium grism yielding a spectral resolution (lambda) /(Delta) (lambda) equals 200 for a 1 arcsec slit has already been successfully commissioned. The manufacturing process, the status and performances will be presented. Moreover we show some astronomical results.

© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Hans-Ulrich Kaeufl ; Karl Kuehl and Steffan Vogel
"Grisms from germanium/silicon for astronomical instruments", Proc. SPIE 3354, Infrared Astronomical Instrumentation, 151 (August 21, 1998); doi:10.1117/12.317257; http://dx.doi.org/10.1117/12.317257


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