Monitoring the aging of high-power laser diode arrays

Jens Wolfgang Tomm; A. Baerwolff; Christoph Lienau; Alexander Richter; A. Jaeger; J. Donecker; A. Gerhardt; Franz X. Daiminger; Stefan Heinemann

doi:10.1117/12.306188

20 April 1998 Monitoring the aging of high-power laser diode arrays

Jens Wolfgang Tomm, A. Baerwolff, Christoph Lienau, Alexander Richter, A. Jaeger, J. Donecker, A. Gerhardt, Franz X. Daiminger, Stefan Heinemann

Author Affiliations +

Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306188
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine

Abstract

Different diagnostic methods were investigated in order to evaluate their potential as aging sensitive tool for the analysis of high-power laser diode arrays. The well-known method of photocurrent spectroscopy, i.e. the measurement of the spectral sensitivity of a laser diode acting as a detector, was found to monitor aging properties of high power laser diode arrays in a convenient way. Photocurrent spectra of high power laser diode arrays emitting at 808 nm (1.53 eV) were investigated in the 0.8 - 3.0 eV photon energy range. Aging induced changes in different spectral regions reveal the influence of difference mechanisms affecting the structure. One aging effect--the growth of the defect concentration within the optically active layers of the devices--is monitored. Conclusions on the microscopic nature of the changes are drawn and several applications are discussed.

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Jens Wolfgang Tomm, A. Baerwolff, Christoph Lienau, Alexander Richter, A. Jaeger, J. Donecker, A. Gerhardt, Franz X. Daiminger, and Stefan Heinemann "Monitoring the aging of high-power laser diode arrays", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306188

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