Paper
1 November 1990 Strategy for contamination control to improve Wide-Field Planetary Camera far-ultraviolet performance
Kim Leschly, Daniel M. Taylor, Teresa K. Jenkins, Jack B. Barengoltz
Author Affiliations +
Abstract
The far-ultraviolet (FLJV) performance of optical imaging instruments using cooled detectors is extremely sensitive to molecular contamination. Conventionally stringent cleanliness standards for material screening hardware fabrication and assembly level test and integration are inadequate for instruments which require a stable FUV performance. A multifaceted contamination control strategy has been developed for the second generation Wide-Field and Planetary Camera (WFPC-2) to improve the FIJV stability by several orders of magnitude compared to the first camera (WFPC-l). This strategy involves: Improved on-orbit boil-off capability of the detector optics added internal shielding and instrument venting in-process subassembly vacuum bakeout at elevated temperatures material substitution sample testing in ultra-clean vacuum facility and internal instrument contamination transport modelling. A science performance goal of 1 photometric accuracy at 1470 Angstrom over an extended time (of at least 30 days) has been established as a contamination control target for WFPC-2. The WFPC-2 is currently planned to be launched by the Shuttle in mid-1993 and replace the WFPC-l which was recently launched with the Hubble Space Telescope (HST). 1.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kim Leschly, Daniel M. Taylor, Teresa K. Jenkins, and Jack B. Barengoltz "Strategy for contamination control to improve Wide-Field Planetary Camera far-ultraviolet performance", Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); https://doi.org/10.1117/12.22592
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Cited by 3 scholarly publications.
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KEYWORDS
Charge-coupled devices

Contamination control

Contamination

Cameras

Control systems

Electronics

Mirrors

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