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Proceedings Article

Laser-based triangulation techniques in optical inspection of industrial structures

[+] Author Affiliations
Timothy A. Clarke, Kenneth T. V. Grattan, N. E. Lindsey

City Univ. (United Kingdom)

Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, 474 (January 1, 1991); doi:10.1117/12.51096
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From Conference Volume 1332

  • Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
  • Chander P. Grover
  • San Diego, CA | July 01, 1990

abstract

An optical triangulation technique using a solid state laser diode sourceand detector, providing sub-pixel resolution on a CCD detector was developed and is discussed. A novel approach to the problem of non-linear accuracy is outlined. Results of extensive research into improving the accuracy of the device with particular reference to configuration, optical components, the laser source, linearity, resolution, calibration and interpolation are presented.

© (1991) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Timothy A. Clarke ; Kenneth T. V. Grattan and N. E. Lindsey
"Laser-based triangulation techniques in optical inspection of industrial structures", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, 474 (January 1, 1991); doi:10.1117/12.51096; http://dx.doi.org/10.1117/12.51096


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