Improvements to real-time ultraviolet scene simulation for sensor testing

David J. Meyer; Paul A. Acevedo; Brian E. O'Toole

doi:10.1117/12.316375

13 July 1998 Improvements to real-time ultraviolet scene simulation for sensor testing

David J. Meyer, Paul A. Acevedo, Brian E. O'Toole

Proceedings Volume 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III; (1998) https://doi.org/10.1117/12.316375
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

The emergence of sensor systems which detect ultraviolet missile signatures defines the need for an ultraviolet environment simulation capability. This paper discusses the development of a real-time hardware-in-the-loop testing capability for ultraviolet missile warning receiver systems. The requirements for real-time ultraviolet simulation will be defined and a real-time architecture which addresses these requirements is presented. The requirements and real-time architecture address the modeling of ultraviolet sensor characteristics and ultraviolet phenomenology. Specific issues which will be addressed include ultraviolet sensor system characteristics, ultraviolet source signature modeling, atmospheric off-axis spatial scatter modeling through the use of the Off-Axis Scattered Intensity Calculation (OSIC) code, and the simulation of these effects in a real-time scene rendering environment. Particular emphasis is placed on the refinement of a lookup table for the OSIC code and consideration for the use of the MSIG ultraviolet missile signature database. Also discussed is the real-time hardware- in-the loop architecture developed for testing of the Common Missile Warning System. This work was performed to support the test and evaluation of modern missile warning systems at Wright Labs Integrated Defense Avionics Lab.

Citation Download Citation

David J. Meyer, Paul A. Acevedo, and Brian E. O'Toole "Improvements to real-time ultraviolet scene simulation for sensor testing", Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); https://doi.org/10.1117/12.316375

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