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Proceedings Article

Fourier-series-based phase and amplitude optical field screen generator for weak atmospheric turbulence

[+] Author Affiliations
James A. Louthain, Byron M. Welsh

Air Force Institute of Technology (USA)

Proc. SPIE 3381, Airborne Laser Advanced Technology, 286 (September 8, 1998); doi:10.1117/12.323950
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From Conference Volume 3381

  • Airborne Laser Advanced Technology
  • Todd D. Steiner; Paul H. Merritt
  • Orlando, FL | April 13, 1998

abstract

A new atmospheric screen generator is developed for use in performance calculations of adaptive optics and imaging systems. The generator is valid over a wide range of atmospheric turbulence parameters and incorporates both phase and amplitude effects. The new screen generator accounts for diffraction effects caused by turbulence and incorporates the phase, amplitude, and cross statistics of a weak turbulence model. The second order statistics of the phase and amplitude perturbations are based on the auto- correlation functions developed by Lee and Harp and the cross-correlation of the phase and amplitude perturbations derived in this paper. The correlations are derived by modeling the turbulence as a number of layers of randomly varying refractivity perpendicular to the propagation path. As the field propagates through the medium, diffraction occurs at each of the layers. A Fourier series expansion of the wavefront phase and amplitude is used. The screen generator uses the power and cross spectral densities of the phase and amplitude perturbations. The mean square value and the structure functions of the wavefront phase and amplitude are calculated in a Monte Carlo experiment and shown to be within 1% of the theoretical value.

© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

James A. Louthain and Byron M. Welsh
"Fourier-series-based phase and amplitude optical field screen generator for weak atmospheric turbulence", Proc. SPIE 3381, Airborne Laser Advanced Technology, 286 (September 8, 1998); doi:10.1117/12.323950; http://dx.doi.org/10.1117/12.323950


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