Electromagnetic field in optics

Peter Varga; Peter Torok

doi:10.1117/12.323324

29 September 1998 Electromagnetic field in optics

Peter Varga, Peter Torok

Proceedings Volume 3407, International Conference on Applied Optical Metrology; (1998) https://doi.org/10.1117/12.323324
Event: International Conference on Applied Optical Metrology, 1998, Balatonfured, Hungary

Abstract

A linearly polarized plane wave traversing an optically transparent system rarely maintains its linear polarization. In this work we discuss two aspects of this phenomenon. First, we consider the effect of a high aperture lens on polarization. This case is of utmost importance in confocal and near field microscopy and, in general, focusing. Second, the role of the polarization in hologram reconstruction is discussed.

Citation Download Citation

Peter Varga and Peter Torok "Electromagnetic field in optics", Proc. SPIE 3407, International Conference on Applied Optical Metrology, (29 September 1998); https://doi.org/10.1117/12.323324

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