Effect of zinc diffusion on the device performance of semi-insulating buried crescent lasers

Ching Long Jiang; Maria D. Ferreira; Robert J. Miller; Mark Mashas; Mark Soler; Keith Wilder; Eugene A. Imhoff; John D. Kulick; Randy Wilson

doi:10.1117/12.176628

1 June 1994 Effect of zinc diffusion on the device performance of semi-insulating buried crescent lasers

Ching Long Jiang, Maria D. Ferreira, Robert J. Miller, Mark Mashas, Mark Soler, Keith Wilder, Eugene A. Imhoff, John D. Kulick, Randy Wilson

Author Affiliations +

Proceedings Volume 2148, Laser Diode Technology and Applications VI; (1994) https://doi.org/10.1117/12.176628
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

The effect of zinc diffusion on the device performance of semi-insulating buried crescent (SIBC) lasers was analyzed by electron beam induced current and scanning electron microscope techniques. A novel liquid phase epitaxy regrowth technique has been developed to minimize the zinc diffusion into the iron-doped semi-insulating indium phosphide blocking layer. This technique has been demonstrated to improve the device performance of SIBC lasers.

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Ching Long Jiang, Maria D. Ferreira, Robert J. Miller, Mark Mashas, Mark Soler, Keith Wilder, Eugene A. Imhoff, John D. Kulick, and Randy Wilson "Effect of zinc diffusion on the device performance of semi-insulating buried crescent lasers", Proc. SPIE 2148, Laser Diode Technology and Applications VI, (1 June 1994); https://doi.org/10.1117/12.176628

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