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Proceedings Article

Subpixel measurement of image features based on paraboloid surface fit

[+] Author Affiliations
Shaun S. Gleason, Martin A. Hunt, William B. Jatko

Oak Ridge National Lab. (USA)

Proc. SPIE 1386, Machine Vision Systems Integration in Industry, 135 (March 1, 1991); doi:10.1117/12.25387
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From Conference Volume 1386

  • Machine Vision Systems Integration in Industry
  • Bruce G. Batchelor; Frederick M. Waltz
  • Boston, MA | September 03, 1991

abstract

A digiuil image processing inspection system is under development at Oak Ridge National Laboratory that will locate image features on printed material and measure distances between them to accuracies of 0. 001 in. An algorithm has been developed for this system that can locate unique image features to subpixel accuracies. It is based on a least-squares fit of a paraboloid function to the surface generated by correlating a reference image feature against a test image search area. Normalizing the correlation surface makes the algorithm robust in the presence of illumination variations and local flaws. Subpixel accuracies of better than 1/16 of a pixel have been achieved using a variety of different reference image features.

© (1991) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Shaun S. Gleason ; Martin A. Hunt and William B. Jatko
"Subpixel measurement of image features based on paraboloid surface fit", Proc. SPIE 1386, Machine Vision Systems Integration in Industry, 135 (March 1, 1991); doi:10.1117/12.25387; http://dx.doi.org/10.1117/12.25387


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