Fourier transform refractometry

Simon G. Kaplan; Leonard M. Hanssen; Ulf Griesmann; Rajeev Gupta

doi:10.1117/12.326666

8 October 1998 Fourier transform refractometry

Simon G. Kaplan, Leonard M. Hanssen, Ulf Griesmann, Rajeev Gupta

Proceedings Volume 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials; (1998) https://doi.org/10.1117/12.326666
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We describe instrumentation that has been constructed at the National Institute of Standards and Technology (NIST) for measurement of the index of refraction of solid materials in the spectral region from 0.5 micrometer to 1000 micrometer using Fourier-transform based spectrophotometers and etalon samples. Preliminary index of refraction measurements have been performed on fused silica and arsenic trisulfide glass samples from 0.5 micrometer to 12 micrometer, and the results are compared to tabulated values on these materials.

Citation Download Citation

Simon G. Kaplan, Leonard M. Hanssen, Ulf Griesmann, and Rajeev Gupta "Fourier transform refractometry", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); https://doi.org/10.1117/12.326666

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