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Proceedings Article

Fourier transform refractometry

[+] Author Affiliations
Simon G. Kaplan, Leonard M. Hanssen, Ulf Griesmann, Rajeev Gupta

National Institute of Standards and Technology (USA)

Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, 203 (October 8, 1998); doi:10.1117/12.326666
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From Conference Volume 3425

  • Optical Diagnostic Methods for Inorganic Transmissive Materials
  • Raju V. Datla; Leonard M. Hanssen
  • San Diego, CA, USA | July 19, 1998

abstract

We describe instrumentation that has been constructed at the National Institute of Standards and Technology (NIST) for measurement of the index of refraction of solid materials in the spectral region from 0.5 micrometer to 1000 micrometer using Fourier-transform based spectrophotometers and etalon samples. Preliminary index of refraction measurements have been performed on fused silica and arsenic trisulfide glass samples from 0.5 micrometer to 12 micrometer, and the results are compared to tabulated values on these materials.

© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Simon G. Kaplan ; Leonard M. Hanssen ; Ulf Griesmann and Rajeev Gupta
"Fourier transform refractometry", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, 203 (October 8, 1998); doi:10.1117/12.326666; http://dx.doi.org/10.1117/12.326666


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