Optical testing with wavelength scanning interferometer

Katsuyuki Okada; Jumpei Tsujiuchi

doi:10.1117/12.26113

1 March 1991 Optical testing with wavelength scanning interferometer

Katsuyuki Okada, Jumpei Tsujiuchi

Proceedings Volume 1400, Optical Fabrication and Testing; (1991) https://doi.org/10.1117/12.26113
Event: Singapore, 1990, -, Singapore

Abstract

Wavelength change in a unbalanced interferometer makes phase change in interferograms, and this phenomenon can be used for the purpose of phase shifting interferometry. As an example of measurements, an optical plane parallel plate is tested, and the simultaneous measurement of both front and rear surfaces together with inhomogeneity of refractive index can be carried out. A new method for calculating phase distribution is developed under the condition where nonlinearity of tuning wavelength and fluctuation of output power take place.

Citation Download Citation

Katsuyuki Okada and Jumpei Tsujiuchi "Optical testing with wavelength scanning interferometer", Proc. SPIE 1400, Optical Fabrication and Testing, (1 March 1991); https://doi.org/10.1117/12.26113

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available