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Proceedings Article

Methods for CCD camera characterization

[+] Author Affiliations
James C. Mullikin

Delft Univ. of Technology (Netherlands) and Lawrence Berkeley Lab. (USA)

Lucas J. van Vliet, H. Netten, Frank R. Boddeke, G. van der Feltz, Ian T. Young

Delft Univ. of Technology (Netherlands)

Proc. SPIE 2173, Image Acquisition and Scientific Imaging Systems, 73 (May 5, 1994); doi:10.1117/12.175165
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From Conference Volume 2173

  • Image Acquisition and Scientific Imaging Systems
  • Helen C. Titus; Amir Waks
  • San Jose, CA | February 06, 1994

abstract

In this paper we present methods for characterizing CCD cameras. Interesting properties are linearity of photometric response, signal-to-noise ratio, sensitivity, dark current, and spatial frequency response. The techniques to characterize CCD cameras are carefully designed to assist one in selecting a camera to solve a certain problem. The methods described were applied to a variety of cameras: an Astromed TE3/A with P86000 chip, a Photometrics CC200 series with Thompson chip TH7882, a Photometrics CC200 series with Kodak chip KAF1400, a Xillix' Micro Imager 1400 with Kodak chip KAF1400, an HCS MXR CCD with a Philips chip and a Sony XC-77RRCE.

© (1994) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

James C. Mullikin ; Lucas J. van Vliet ; H. Netten ; Frank R. Boddeke ; G. van der Feltz, et al.
"Methods for CCD camera characterization", Proc. SPIE 2173, Image Acquisition and Scientific Imaging Systems, 73 (May 5, 1994); doi:10.1117/12.175165; http://dx.doi.org/10.1117/12.175165


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