Paper
23 March 1994 Simulation study for different moment sets
Author Affiliations +
Proceedings Volume 2181, Document Recognition; (1994) https://doi.org/10.1117/12.171127
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States
Abstract
Analysis of variance for coefficient of variation is performed under various noise levels and moment orders. As a measure for response stability for features in a pattern recognition system, the coefficient of variation is analyzed and compared among various moment sets, such as, the geometric moments, Legendre moments, complex moments, rotational moments and Zernike moments. A convenient definition for binary segmented images is introduced in order to quantify the level of the noise in the noisy patterns. Traditional two-way table data analysis is carried out to fit the nearly additively structured data and the analysis of variance is done on the fittings (row and column effects). A simple summary for the fittings is displayed by boxplots to show the distribution of effects due to the various noise levels and the moment orders. Among the different moment sets, the Zernike moments are shown to be optimal in the sense that Zernike moments are reliable features with the property of least varying response under various noise and orders.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Woogon Chung and Evangelia Micheli-Tzanakou "Simulation study for different moment sets", Proc. SPIE 2181, Document Recognition, (23 March 1994); https://doi.org/10.1117/12.171127
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KEYWORDS
Signal to noise ratio

Pattern recognition

Binary data

Image segmentation

Zernike polynomials

Data analysis

Data modeling

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