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Proceedings Article

Replication of a multilayer supermirror

[+] Author Affiliations
Akihiro Furuzawa, Koujun Yamashita, Hideyo Kunieda, Yuzuru Tawara, Keisuke Tamura, Kazutoshi Haga, Norihiko Nakamura, Norio Nakajo, Harumi Takata, Yasushi Ogasaka

Nagoya Univ. (Japan)

Takashi Okajima

Nagoya Univ. (USA)

Gyanendra S. Lodha

Ctr. for Advanced Technology (India)

Yoshiharu Namba

Chubu Univ. (Japan)

Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, 576 (November 19, 1998); doi:10.1117/12.331279
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From Conference Volume 3444

  • X-Ray Optics, Instruments, and Missions
  • Richard B. Hoover; Arthur B. C. Walker II
  • San Diego, CA | July 19, 1998


In the fabrication of the x-ray reflector using the replication method, Au was thought as the only material which can be used as the surface of reflector. However, if we could use the Pt or Ir, these has higher electron density than Au, as the surface, we can obtain higher reflectivity especially in the hard x-ray band. Furthermore, direct replication of the multilayer is very useful for the high reflectivity and mass-production process. We used the Au replica foil as the substrate of the multilayer. However, the epoxy layer of the replica foil was easily damaged by the heat during the deposition. This is a serious problem for the mass-production process, since we must take a long time to deposit the multilayer to keep the high reflectivity. We studied the direct replication of the multilayer, and successes to obtain the reflectivity as high as original one. Furthermore, we keep the trying to improve the quality of the reflector as flight quality. We will report the results and feature prospects of the replication of the multilayer and its application to the hard x-ray telescope.

© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Akihiro Furuzawa ; Koujun Yamashita ; Hideyo Kunieda ; Yuzuru Tawara ; Keisuke Tamura, et al.
"Replication of a multilayer supermirror", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, 576 (November 19, 1998); doi:10.1117/12.331279; http://dx.doi.org/10.1117/12.331279

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