Fast optical metrology of the hard x-ray optics for the High Energy Focusing Telescope (HEFT)

Mario A. Jimenez-Garate; William W. Craig; Charles J. Hailey

doi:10.1117/12.331284

19 November 1998 Fast optical metrology of the hard x-ray optics for the High Energy Focusing Telescope (HEFT)

Mario A. Jimenez-Garate, William W. Craig, Charles J. Hailey

Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331284
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We describe a fast figure metrology system designed for the several thousand mirror quadrants in the High Energy Focusing Telescope (HEFT) balloon experiment. HEFT's multilayer coated hard x-ray optics will have approximately 1 arcminute HEW and operate at 20-80 keV. The optics are a conical approximation to the Wolter I configuration. Our automated system can measure the axial figure error, in- phase and out-of-phase roundness errors of a mirror quadrant, and output their HEW contribution to the x-ray telescope. An optical laser scans a conical mirror in two cylindrical coordinate axes. A 2D position sensitive diode measures the reflected beam to approximately 4 arcseconds. The conical mirror can have >= 3 cm radius. We show the figure measurements of HEFT's aluminum foil and thermally formed glass substrates.

Citation Download Citation

Mario A. Jimenez-Garate, William W. Craig, and Charles J. Hailey "Fast optical metrology of the hard x-ray optics for the High Energy Focusing Telescope (HEFT)", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331284

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