Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

XOP: recent developments

[+] Author Affiliations
Manuel Sanchez del Rio

European Synchrotron Radiation Facility (France)

Roger J. Dejus

Argonne National Lab. (USA)

Proc. SPIE 3448, Crystal and Multilayer Optics, 340 (December 11, 1998); doi:10.1117/12.332522
Text Size: A A A
From Conference Volume 3448

  • Crystal and Multilayer Optics
  • Albert T. Macrander; Andreas K. Freund; Tetsuya Ishikawa; Dennis M. Mills
  • San Diego, CA, USA | July 19, 1998

abstract

XOP (X-ray OPtics utilities) is a graphical user interface (GUI) to run computer programs that calculate basic information needed by synchrotron radiation beamline scientists and engineers. It can also be used as a front end for specific codes or packages for data analysis and data reduction (XAFS, surface crystallography, etc.). XOP contains a customized database for optical and atomic constants. It has a flexible design and new applications may be added. The capabilities of XOP, including those related to simulations of crystal diffraction profiles and multilayer reflectivities, are summarized. We discuss the most recent developments to be included in XOP version 2.0. A few other examples of typical calculations are: insertion device (undulator and wiggler) spectra and angular distributions, mirror and multilayer reflectivities, and crystal diffraction profiles. The computer programs are executed and the results are analyzed within the GUI, which makes them fast and easy to use. The XOP interface is written in the Interactive Data Language (IDL) from Research Systems Inc., and it runs on the Unix (HP, Sun, Linux, DEC-Alpha, and Silicon Graphics), and on the Windows 95/NT operating systems. It has been built with an IDL license embedded and is available under some limited conditions free of charge from the authors.

© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Manuel Sanchez del Rio and Roger J. Dejus
"XOP: recent developments", Proc. SPIE 3448, Crystal and Multilayer Optics, 340 (December 11, 1998); doi:10.1117/12.332522; http://dx.doi.org/10.1117/12.332522


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.