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Proceedings Article

Whole-field vibration phase measurement with electronic speckle pattern interferometry (ESPI)

[+] Author Affiliations
Jesus D. R. Valera, Julian D. C. Jones

Heriot-Watt Univ. (United Kingdom)

Angel F. Doval

Univ. de Vigo (Spain)

Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, 241 (November 15, 1994); doi:10.1117/12.194326
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From Conference Volume 2248

  • Optical Measurements and Sensors for the Process Industries
  • Christophe Gorecki; Richard W. T. Preater
  • Frankfurt, Federal Republic of Germany | June 19, 1994

abstract

A stroboscopically illuminated ESPI system is described for the simultaneous measurement of vibration amplitude and phase. The technique involves modulating both the illumination pulse phase relative to the vibration, and the optical phase of the interferometer reference beam to generate eight video frames which are processed to yield vibration amplitude and phase.

© (1994) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Jesus D. R. Valera ; Julian D. C. Jones and Angel F. Doval
"Whole-field vibration phase measurement with electronic speckle pattern interferometry (ESPI)", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, 241 (November 15, 1994); doi:10.1117/12.194326; http://dx.doi.org/10.1117/12.194326


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