X-ray detector for time-resolved studies

Brian G. Rodricks; Christine M. Brizard; Roy Clarke; Walter P. Lowe

doi:10.1117/12.49463

1 November 1991 X-ray detector for time-resolved studies

Brian G. Rodricks, Christine M. Brizard, Roy Clarke, Walter P. Lowe

Proceedings Volume 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments; (1991) https://doi.org/10.1117/12.49463
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The development of ultrahigh-brightness x-ray sources makes time-resolved x-ray studies more and more feasible. Improvements in x-ray optics components are also critical for obtaining the appropriate beam for a particular type of experiment. Moreover, fast parallel detectors will be essential in order to exploit the combination of high intensity x-ray sources and novel optics for time-resolved experiments. A CCD detector with a time resolution of microseconds has been developed at the Advanced Photon Source (APS). This detector is fully programmable using CAMAC electronics and a MicroVax computer. The techniques of time- resolved x-ray studies, which include scattering, microradiography, microtomography, stroboscopy, etc., can be applied to a range of phenomena (including rapid thermal annealing, surface ordering, crystallization, and the kinetics of phase transition) in order to understand these time-dependent microscopic processes. Some of these applications are illustrated by recent results performed at synchrotrons. New powerful x-ray sources now under construction offer the opportunity to apply innovative approaches in time-resolved work.

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Brian G. Rodricks, Christine M. Brizard, Roy Clarke, and Walter P. Lowe "X-ray detector for time-resolved studies", Proc. SPIE 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments, (1 November 1991); https://doi.org/10.1117/12.49463

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KEYWORDS

Sensors

Crystals

Charge-coupled devices

X-rays

X-ray sources

CCD image sensors

Synchrotrons

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