Paper
14 September 1994 Ellipsometric measurements applied to liquid crystal display technology
Leonard G. Hale, Donald B. Taber, Eric Schonning, Donato Rizzi, William J. Gunning III, John P. Eblen Jr.
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Abstract
Variable angle transmission ellipsometry has been used to characterize the various elements of the liquid crystal display (LCD) architecture. Ellipsometric data, which are in the form of polarization ellipses as a function of incident angle, are analyzed using the 2 X 2 extended Jones matrix formalism. Information which can be deduced from the ellipsometric data includes the birefringence, cell gap, twist angle, and pretilt angle of the liquid crystal cell, polarization efficiency of the polarizers, as well as the retardation values of birefringent compensators. The ellipsometric method is capable of complete characterization of the polarization state of the transmitted light.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leonard G. Hale, Donald B. Taber, Eric Schonning, Donato Rizzi, William J. Gunning III, and John P. Eblen Jr. "Ellipsometric measurements applied to liquid crystal display technology", Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); https://doi.org/10.1117/12.186664
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Liquid crystals

LCDs

Polarization

Wave plates

Polarizers

Data modeling

Control systems

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