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Proceedings Article

Multiaperture overlap-scanning technique for large-aperture test

[+] Author Affiliations
Mingyi Chen, Weiming Cheng, Cun-Wu W. Wang

Shanghai Univ. of Science and Technology (China)

Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, 626 (January 1, 1992); doi:10.1117/12.135344
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From Conference Volume 1553

  • Laser Interferometry IV: Computer-Aided Interferometry
  • Ryszard J. Pryputniewicz
  • San Diego, CA | July 01, 1991

abstract

The subaperture test technique developed by J. Wyant et al. revealed a new approach to solve the problem of testing a large optical surface. Unfortunately, uncertainty in the relative pistons and tilts among individual subapertures leaves a considerable measurement error to that method, which becomes an impediment to its practical applications. As is well known, two interferograms, sampled from the same tested surface by different adjustment of an interferometer, must be different in general. However, the difference between these interferograms gives the right information on the relative change of piston and tilt of the reference wavefront during sequential adjustments. Based on that fact, our lab has recently developed the multiaperture overlap-scanning technique (MAOST) for large aperture optics tests, by which a large optical surface is tested by a sequence of scannings of a small aperture with an overlap area. After processing of all sampled interferograms by a special designed software, the full aperture of the tested optical surface will be regained precisely. In this paper, the principle and the mathematical model of MAOST is described, and results of applying MAOST to test two optical flats with an aperture magnification ratio up to 2.6 are also given.

© (1992) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Mingyi Chen ; Weiming Cheng and Cun-Wu W. Wang
"Multiaperture overlap-scanning technique for large-aperture test", Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, 626 (January 1, 1992); doi:10.1117/12.135344; http://dx.doi.org/10.1117/12.135344


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