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Proceedings Article

New 3D profilometry based on modulation measurement

[+] Author Affiliations
Xianyu Su, Likun Su, Wansong Li, Liqun Xiang

Sichuan Union Univ. (China)

Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, 1 (August 10, 1998); doi:10.1117/12.318337
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From Conference Volume 3558

  • Automated Optical Inspection for Industry: Theory, Technology, and Applications II
  • Shenghua Ye
  • Beijing, China | September 16, 1998

abstract

Not available

© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Topics

Modulation
Citation

Xianyu Su ; Likun Su ; Wansong Li and Liqun Xiang
"New 3D profilometry based on modulation measurement", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, 1 (August 10, 1998); doi:10.1117/12.318337; http://dx.doi.org/10.1117/12.318337


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