Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflection

[+] Author Affiliations
Hui Li, Zukang Lu

Zhejiang Univ. (China)

Shusen Xie

Fujian Teachers Univ. (China)

Lei Lin

Fujian Teachers Univ. (USA)

Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, 491 (August 10, 1998); doi:10.1117/12.318445
Text Size: A A A
From Conference Volume 3558

  • Automated Optical Inspection for Industry: Theory, Technology, and Applications II
  • Shenghua Ye
  • Beijing, China | September 16, 1998

abstract

A new method to measure refractive index and the accuracy analysis as well is presented. The characteristic includes that the direction of incident light is not perpendicular to the interface but close to the critical angle of total internal reflection. That the specular reflectivity changes sharply near the critical angle implies that a high measuring sensitivity be reached easily. A narrow p- polarized laser beam and a prism or a quasi-semi-cylindrical lens in contact with a sample are applied in the apparatus. In order to match a high accuracy, a photoelectronic receiver with dual-channel divider is designed to compensate the stability of output of laser. One of the advantages of the method is its high accuracy. The uncertainty in the refractive index measurement is in the fourth decimal place at least. The exact direction of incident laser beam depends on the accuracy of result expected. Another outstanding advantage is its particularly straightforward in use experimental techniques. The method will be the most promising tool to study the response of refractive index to subtle changes of different conditions.

© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Hui Li ; Zukang Lu ; Shusen Xie and Lei Lin
"Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflection", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, 491 (August 10, 1998); doi:10.1117/12.318445; http://dx.doi.org/10.1117/12.318445


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement


  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.