High-resolution millimeter-wave imaging system for defect characterization in dielectric slabs

Sasan Bakhtiari; Nachappa Gopalsami; Apostolos C. Raptis; Matthew J. Lepper

doi:10.1117/12.186730

14 September 1994 High-resolution millimeter-wave imaging system for defect characterization in dielectric slabs

Sasan Bakhtiari, Nachappa Gopalsami, Apostolos C. Raptis, Matthew J. Lepper

Proceedings Volume 2275, Advanced Microwave and Millimeter-Wave Detectors; (1994) https://doi.org/10.1117/12.186730
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Preliminary results are presented for a millimeter-wavelength free-space imaging system used to detect and characterize defects in layered dielectric composite slabs. Such systems throughout the microwave spectrum have shown great potential as alternative nondestructive evaluation tools for on-line, in-situ examination of low-loss dielectric materials such as plastics, ceramics, and various dielectric composites. Results of a fixed-frequency W-band imaging system operating in either through-transmission or reflection mode are presented here. Incorporation of focused-beam antennas allows high-resolution measurement of small variations within the sample under test. The results are based on measurement of the relative amplitude and phase of the reflected or transmitted wave in monostatic or bistatic configurations, respectively. With proper calibration, the measured parameters can be used to estimate dielectric property variations within the material media. A theoretical simulation for plane wave propagation in a multilayered media is used to interpret the measurement results.

Citation Download Citation

Sasan Bakhtiari, Nachappa Gopalsami, Apostolos C. Raptis, and Matthew J. Lepper "High-resolution millimeter-wave imaging system for defect characterization in dielectric slabs", Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); https://doi.org/10.1117/12.186730

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available