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Proceedings Article

Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating

[+] Author Affiliations
Rainer Heintzmann, Christoph G. Cremer

Univ. of Heidelberg (Germany)

Proc. SPIE 3568, Optical Biopsies and Microscopic Techniques III, 185 (January 19, 1999); doi:10.1117/12.336833
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From Conference Volume 3568

  • Optical Biopsies and Microscopic Techniques III
  • Irving J. Bigio; Herbert Schneckenburger; Jan Slavik; Katarina Svanberg; Pierre M. Viallet
  • Stockholm, Sweden | September 08, 1998

abstract

High spatial frequencies in the illuminating light of microscopes lead to a shift of the object spatial frequencies detectable through the objective lens. If a suitable procedure is found for evaluation of the measured data, a microscopic image with a higher resolution than under flat illumination can be obtained. A simple method for generation of a laterally modulated illumination pattern is discussed here. A specially constructed diffraction grating was inserted in the illumination beam path at the conjugate object plane (position of the adjustable aperture) and projected through the objective into the object. Microscopic beads were imaged with this method and evaluated with an algorithm based on the structure of the Fourier space. The results indicate an improvement of resolution.

© (1999) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Rainer Heintzmann and Christoph G. Cremer
"Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating", Proc. SPIE 3568, Optical Biopsies and Microscopic Techniques III, 185 (January 19, 1999); doi:10.1117/12.336833; http://dx.doi.org/10.1117/12.336833


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