Integrated x-ray testing of the electro-optical breadboard model for the X-ray Multimirror Mission (XMM) reflection grating spectrometer

Jay V. Bixler; Henry J. M. Aarts; Wolfgang Burkert; Antonius J. F. den Boggende; Graziella Branduardi-Raymont; Heinrich W. Braeuninger; A. C. Brinkman; William W. Craig; Todd A. Decker; Luc Dubbeldam; Christian Erd; Charles J. Hailey; Jan-Willem den Herder; Fred A. Jansen; Steven M. Kahn; Piet A. J. de Korte; C. W. Mauche; Frits B. S. Paerels; Knud Thomsen

doi:10.1117/12.186828

16 September 1994 Integrated x-ray testing of the electro-optical breadboard model for the X-ray Multimirror Mission (XMM) reflection grating spectrometer

Jay V. Bixler, Henry J. M. Aarts, Wolfgang Burkert, Antonius J. F. den Boggende, Graziella Branduardi-Raymont, Heinrich W. Braeuninger, A. C. Brinkman, William W. Craig, Todd A. Decker, Luc Dubbeldam, Christian Erd, Charles J. Hailey, Jan-Willem den Herder, Fred A. Jansen, Steven M. Kahn, Piet A. J. de Korte, C. W. Mauche, Frits B. S. Paerels, Knud Thomsen

Author Affiliations +

Proceedings Volume 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V; (1994) https://doi.org/10.1117/12.186828
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

X-ray calibration of the Electro-Optical Breadboard Model (EOBB) of the XMM Reflection Grating Spectrometer has been carried out at the Panter test facility in Germany. The EOBB prototype optics consisted of a four-shell grazing incidence mirror module followed by an array of eight reflection gratings. The dispersed x-rays were detected by an array of three CCDs. Line profile and efficiency measurements were made at several energies, orders, and geometric configurations for individual gratings and for the grating array as a whole. The x-ray measurements verified that the grating mounting method would meet the stringent tolerances necessary for the flight instrument. Post EOBB metrology of the individual gratings and their mountings confirmed the precision of the grating boxes' fabrication. Examination of the individual grating surface's at micron resolution revealed the cause of anomalously wide line profiles to be scattering due to the crazing of the replica's surface.

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Jay V. Bixler, Henry J. M. Aarts, Wolfgang Burkert, Antonius J. F. den Boggende, Graziella Branduardi-Raymont, Heinrich W. Braeuninger, A. C. Brinkman, William W. Craig, Todd A. Decker, Luc Dubbeldam, Christian Erd, Charles J. Hailey, Jan-Willem den Herder, Fred A. Jansen, Steven M. Kahn, Piet A. J. de Korte, C. W. Mauche, Frits B. S. Paerels, and Knud Thomsen "Integrated x-ray testing of the electro-optical breadboard model for the X-ray Multimirror Mission (XMM) reflection grating spectrometer", Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); https://doi.org/10.1117/12.186828

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