Paper
28 December 1998 Mobile large-vehicle inspection system design issues
Gerald J. Smith, William L. Adams, Suzhou Huang
Author Affiliations +
Proceedings Volume 3575, Enforcement and Security Technologies; (1998) https://doi.org/10.1117/12.335004
Event: Enabling Technologies for Law Enforcement and Security, 1998, Boston, MA, United States
Abstract
X-ray systems capable of scanning semitrailers using conventional fanbeam technology are restricted to transmission-based imaging techniques that suffer from superposition of clutter. MobileSearchTM I is a truck-mounted 450 KeV pencil beam system incorporating x-ray backscatter imaging to produce near photo-like images, which was reported on in a paper by Swift in 1996. Since that time MobileSearchTM II added a transmission detector providing both backscatter and transmission in a single pass. The transmission detector design is the result of extensive x-ray and optical simulations. The radiation safety was studied extensively using the GEANT2 simulation system. The simulations were extended from 450 KeV to 5 MeV, to determine the safety implications of increasing the x-ray energy. Operationally, a 14 foot high, 8 foot 6 inch wide vehicle can be parked on a level area and the MobileSearchTM II system driven alongside to examine the contents. Deployment and setup are facilitated by having a self-contained system, which can be driven over the road and cen be operational in less than an hour. MobileSearchTM II is also capable of continuous mode scanning. In this mode, a line of vehicles can be scanned without having to stop and reposition or queue vehicles. The system is designed to fit in a C17 for easy air transport to a distant location.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerald J. Smith, William L. Adams, and Suzhou Huang "Mobile large-vehicle inspection system design issues", Proc. SPIE 3575, Enforcement and Security Technologies, (28 December 1998); https://doi.org/10.1117/12.335004
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KEYWORDS
Sensors

X-rays

Backscatter

Imaging systems

Inspection

Safety

Optical simulations

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