Paper
25 June 1999 Simulation of resist heating using TEMPTATION software with different models of electron-beam energy deposition
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Abstract
In electron lithography, resist heating is a serious practical problem that requires proper modeling. To decrease complexity of the problem, simplified representations of a single electron heat source were examined. This was shown that simplified descriptions can lead to significant errors in temperature simulation. These simple models can only be used for temperature simulation at a long time/long distance from the current electron flash. An analytic mode of electron scattering and Monte Carlo modeling have shown comparably good accuracy when used for thermal simulations. They both were embedded in TEMPTATION software tool.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Igor Yu. Kuzmin "Simulation of resist heating using TEMPTATION software with different models of electron-beam energy deposition", Proc. SPIE 3676, Emerging Lithographic Technologies III, (25 June 1999); https://doi.org/10.1117/12.351126
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Cited by 2 scholarly publications.
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KEYWORDS
Monte Carlo methods

Glasses

Electron beams

Convolution

Electron beam lithography

Optical simulations

Photomasks

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