Fourier transform infrared spectroscopy for process monitoring and control

Peter R. Solomon; Philip W. Morrison Jr.; Michael A. Serio; Robert M. Carangelo; James R. Markham; Stephen C. Bates; Joseph E. Cosgrove

doi:10.1117/12.137746

14 August 1992 Fourier transform infrared spectroscopy for process monitoring and control

Peter R. Solomon, Philip W. Morrison Jr., Michael A. Serio, Robert M. Carangelo, James R. Markham, Stephen C. Bates, Joseph E. Cosgrove

Author Affiliations +

Proceedings Volume 1681, Optically Based Methods for Process Analysis; (1992) https://doi.org/10.1117/12.137746
Event: SPIE's 1992 Symposium on Process Control and Monitoring, 1992, Somerset, NJ, United States

Abstract

An important requirement in many industries is the ability to perform on-line monitoring and control of harsh, multi-phase process streams. During the last ten years, significant progress has occurred in the hardware and applications for Fourier Transform Infrared (FT-IR) spectroscopy. Instrumentation is now available which can perform, in harsh environments, continuous unattended and simultaneous measurements of absorbed (or reflected) and emitted radiation. The applications of FT-IR include: (1) concentrations of multiple species and phases (gases, liquid, particles, surfaces) as low as ppb; (2) temperatures of multiple species and phases (gases, liquid, particles, surfaces) with accuracies as good as +/- 1 degree(s)C at any elevated temperature; (3) measurement of particle sizes; (4) measurement of film thickness; (5) in-situ line-of-sight data; (6) in-situ spatially resolved data using tomography; (7) data on extracted samples; and (8) data on time scales as short as a few milliseconds.

Citation Download Citation

Peter R. Solomon, Philip W. Morrison Jr., Michael A. Serio, Robert M. Carangelo, James R. Markham, Stephen C. Bates, and Joseph E. Cosgrove "Fourier transform infrared spectroscopy for process monitoring and control", Proc. SPIE 1681, Optically Based Methods for Process Analysis, (14 August 1992); https://doi.org/10.1117/12.137746

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