Paper
14 July 1995 Behavior of laser-induced emission intensity versus laser power density during breakdown of optical materials
Xianglei Mao, Andres J. Fernandez, Richard E. Russo
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Abstract
Breakdown in SiO2 is studied versus fluence using an intensified CCD spectrometer. Broad-band photoluminescence spectra were measured versus number of laser pulses. Before the breakdown of fused silica, the intensity of this photoluminescence increases. After breakdown, a plasma is formed and ablated Si emission lines are measured. The plasma is characterized by its emission spectra and excitation temperature temporal profiles. The temperature profiles of the plasma are calculated by the Bolzmann method. These data are studied to provide fundamental information of breakdown mechanisms in optical materials.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xianglei Mao, Andres J. Fernandez, and Richard E. Russo "Behavior of laser-induced emission intensity versus laser power density during breakdown of optical materials", Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); https://doi.org/10.1117/12.213739
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Cited by 4 scholarly publications.
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KEYWORDS
Luminescence

Silicon

Plasma

Silica

Spectroscopy

Charge-coupled devices

Absorption

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