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Proceedings Article

Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory

[+] Author Affiliations
Michael D. Feit, Alexander M. Rubenchik, Bruce W. Shore, Brent C. Stuart, Michael D. Perry

Lawrence Livermore National Lab. (USA)

Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, 469 (July 14, 1995); doi:10.1117/12.213727
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From Conference Volume 2428

  • Laser-Induced Damage in Optical Materials: 1994
  • Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian E. Newnam; M. J. Soileau
  • Boulder, CO | October 24, 1994

abstract

Our extensive measurements of damage thresholds for fused silica and several fluorides (LiF, CaF, MgF, and BaF) at 1053 and 526 nm for pulse durations, (tau) , ranging from 275 fs to 1 ns are reported elsewhere at this meeting. A theoretical model based on electron production via multiphoton ionization, Joule heating, and collisional (avalanche) ionization is in good agreement with experimental results.

© (1995) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Michael D. Feit ; Alexander M. Rubenchik ; Bruce W. Shore ; Brent C. Stuart and Michael D. Perry
"Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory", Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, 469 (July 14, 1995); doi:10.1117/12.213727; http://dx.doi.org/10.1117/12.213727


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