Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Polarimetric characterization of Spectralon

[+] Author Affiliations
Dennis H. Goldstein

Air Force Research Lab. (USA)

David B. Chenault, J. L. Pezzaniti

SY Technology, Inc. (USA)

Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, 126 (October 25, 1999); doi:10.1117/12.366323
Text Size: A A A
From Conference Volume 3754

  • Polarization: Measurement, Analysis, and Remote Sensing II
  • Dennis H. Goldstein; David B. Chenault
  • Denver, CO, USA | July 18, 1999

abstract

A polarimetric characterization of the reflective standard material Spectralon is presented. Samples of Spectralon with reflectances of 2 percent, 50 percent, 75 percent and 99 percent were examined. The characterization was accomplished using the Air Force Research Laboratory's spectropolarimeter in reflection mode. Data are presented for the spectral region .65 to 1.0 micrometers. Polarizance was measured for the four Spectralon samples at eight input beam incidence angles. All observations were made from normal to the Spectralon. It was found that as the incidence beam angle increases, the polarizance increases; and as the reflectance of the samples decreases, the polarizance increases.

© (1999) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Dennis H. Goldstein ; David B. Chenault and J. L. Pezzaniti
"Polarimetric characterization of Spectralon", Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, 126 (October 25, 1999); doi:10.1117/12.366323; http://dx.doi.org/10.1117/12.366323


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.