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Proceedings Article

Uncooled thermal imaging at Texas Instruments

[+] Author Affiliations
Charles M. Hanson, Howard R. Beratan, Robert A. Owen, Mac Corbin, S. McKenney

Texas Instruments Inc. (USA)

Proc. SPIE 1735, Infrared Detectors: State of the Art, 17 (December 10, 1992); doi:10.1117/12.138624
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From Conference Volume 1735

  • Infrared Detectors: State of the Art
  • Wagih H. Makky
  • San Diego, CA | July 19, 1992

abstract

Texas Instruments has developed a new thermal imaging technology based upon focal plane arrays (FPAs) using the pyroelectric effect in ceramic barium-strontium titanate (BST). These devices operate near the paraelectric-ferroelectric phase transition, which, for the selected composition of BST, is near room temperature. The detector elements operate in the voltage mode with a bias voltage applied to maintain and optimize the pyroelectric effect near the phase transition. The BST array attaches via bump-bonding to a CMOS readout circuit that filters, buffers and multiplexes the output signals. These FPAs have facilitated the development of a system technology capable of satisfying a wide variety of applications, including surveillance devices, weapons sights, missile seekers and driver's aids. Resulting systems are performance-competitive with scanned FLIRs in these applications, and they are smaller in size, lighter in weight, and require less power than scanned FLIRs. Simplicity and compactness of the system designs will result in production costs competitive with image intensification devices.

© (1992) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Charles M. Hanson ; Howard R. Beratan ; Robert A. Owen ; Mac Corbin and S. McKenney
"Uncooled thermal imaging at Texas Instruments", Proc. SPIE 1735, Infrared Detectors: State of the Art, 17 (December 10, 1992); doi:10.1117/12.138624; http://dx.doi.org/10.1117/12.138624


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