Paper
23 November 1999 Smoothing of mirror substrates by thin-film deposition
Eberhard Adolf Spiller, Sherry L. Baker, Enrique Parra, Charles Tarrio
Author Affiliations +
Abstract
Superpolished optical flats with high spatial frequency roughness below 0.1 nm have been commercially available for years. However, it is much more difficult to obtain figured optics of similar quality. We have obtained and tested the finish of figured optics from different vendors by atomic force microscopy and optical profilometry and have investigated how the substrate quality can be improved by the deposition of thin films. We have determined the growth parameters of several thin-film structures. From these parameters we can determine how the surface topography of a coated mirror differs from that of the substrate, select the best thin-film structure, and predict the possible improvement.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eberhard Adolf Spiller, Sherry L. Baker, Enrique Parra, and Charles Tarrio "Smoothing of mirror substrates by thin-film deposition", Proc. SPIE 3767, EUV, X-Ray, and Neutron Optics and Sources, (23 November 1999); https://doi.org/10.1117/12.371112
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Cited by 20 scholarly publications.
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KEYWORDS
Mirrors

Multilayers

Silicon

Thin films

Spatial frequencies

Atomic force microscopy

Extreme ultraviolet

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