Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Edge diffraction in Monte Carlo ray tracing

[+] Author Affiliations
Edward R. Freniere, G. Groot Gregory, Richard A. Hassler

Lambda Research Corp. (USA)

Proc. SPIE 3780, Optical Design and Analysis Software, 151 (September 27, 1999); doi:10.1117/12.363773
Text Size: A A A
From Conference Volume 3780

  • Optical Design and Analysis Software
  • Richard C. Juergens
  • Denver, CO, USA | July 18, 1999

abstract

Monte Carlo ray tracing programs are now being used to solve many optical analysis problems in which the entire optomechanical system must be considered. In many analyses, it is desired to consider the effects of diffraction by mechanical edges. Smoothly melding the effects of diffraction, a wave phenomenon, into a ray-tracing program is a significant technical challenge. This paper discusses the suitability of several methods of calculating diffraction for use in ray tracing programs. A method based on the Heisenberg Uncertainty Principle was chosen for use in TracePro, a commercial Monte Carlo ray tracing program, and is discussed in detail.

© (1999) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Edward R. Freniere ; G. Groot Gregory and Richard A. Hassler
"Edge diffraction in Monte Carlo ray tracing", Proc. SPIE 3780, Optical Design and Analysis Software, 151 (September 27, 1999); doi:10.1117/12.363773; http://dx.doi.org/10.1117/12.363773


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.