Paper
20 November 1992 Determination of optical constant of diamond thin films
Xuantong Ying, Yuanhua Shen, Hang Xue, Jianhai Liu, Zhongjing Xing, Jianzhong Xu, Fengshan Zhang
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Abstract
Refractive index N, extinction coefficient k, and surface roughness (alpha) of synthetic diamond thin films are strongly dependent on the growth process. The current presentation describes a multiparameter optical transmittance curve fitting method to determine refractive index n, extinction coefficient k, thickness t, and surface roughness (alpha) of synthetic CVD diamond thin films taking account optical scattering of the light by the coating surface. All the data in this method, instead of extreme values in the conventional enveloped method, of IR transmittance curve are used to fit the above properties of diamond films in a short time by specially developed computer software. The accuracy of determination can be improved.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xuantong Ying, Yuanhua Shen, Hang Xue, Jianhai Liu, Zhongjing Xing, Jianzhong Xu, and Fengshan Zhang "Determination of optical constant of diamond thin films", Proc. SPIE 1759, Diamond Optics V, (20 November 1992); https://doi.org/10.1117/12.130775
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Cited by 5 scholarly publications.
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KEYWORDS
Diamond

Refractive index

Thin films

Transmittance

Chemical vapor deposition

Surface roughness

Light scattering

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