Phase 2 analysis of Spectralon material for use in on-board calibration systems for the medium-resolution imaging spectrometer (MERIS)

James E. Leland; Angelo V. Arecchi

doi:10.1117/12.211278

6 June 1995 Phase 2 analysis of Spectralon material for use in on-board calibration systems for the medium-resolution imaging spectrometer (MERIS)

James E. Leland, Angelo V. Arecchi

Author Affiliations +

Proceedings Volume 2475, Infrared Detectors and Instrumentation for Astronomy; (1995) https://doi.org/10.1117/12.211278
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

This paper is a report on the ongoing flight evaluation testing of Spectralon, a diffuse reflectance material which is slated for use as a calibration panel for several satellite-based earth-observing instruments. The present study focuses on tests of the stability of the material under exposure to levels of UV/VUV radiation which match those of the low-earth orbit environment. In earlier UV/VUV exposure tests, some degradation of the optical properties of the material were observed; this optical degradation has been linked to photochemical degradation of organic contaminants. A more stringent manufacturing protocol was designed to eliminate these contaminants. The second phase of UV/VUV exposure testing, reported here, was undertaken with the object of validating and optimizing this new manufacturing protocol. Results of this testing indicate that the new manufacturing protocol yields a significant improvement in the optical stability of Spectralon under UV/VUV exposure. These results also indicate that most of the observed degradation is caused by exposure to radiation in the 200 - 380 nm band. This finding suggests new avenues of investigation, as well as providing justification for a simplification of future test requirements.

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James E. Leland and Angelo V. Arecchi "Phase 2 analysis of Spectralon material for use in on-board calibration systems for the medium-resolution imaging spectrometer (MERIS)", Proc. SPIE 2475, Infrared Detectors and Instrumentation for Astronomy, (6 June 1995); https://doi.org/10.1117/12.211278

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