Paper
13 March 2015 (-201) β-Gallium oxide substrate for high quality GaN materials
I. S. Roqan, M. M. Muhammed
Author Affiliations +
Proceedings Volume 9364, Oxide-based Materials and Devices VI; 93641K (2015) https://doi.org/10.1117/12.2076475
Event: SPIE OPTO, 2015, San Francisco, California, United States
Abstract
(-201) oriented β-Ga2O3 has the potential to be used as a transparent and conductive substrate for GaN-growth. The key advantages of Ga2O3 are its small lattice mismatches (4.7%), appropriate structural, thermal and electrical properties and a competitive price compared to other substrates. Optical characterization show that GaN layers grown on (-201) oriented β-Ga2O3 are dominated by intense bandedge emission with a high luminescence efficiency. Atomic force microscopy studies show a modest threading dislocation density of ~108 cm-2, while complementary Raman spectroscopy indicates that the GaN epilayer is of high quality with slight compressive strain. Room temperature time-findings suggest that the limitation of the photoluminescence lifetime (~500 ps) is due to nonradiative recombination arising from threading dislocation. Therefore, by optimizing the growth conditions, high quality material with significant optical efficiency can be obtained.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. S. Roqan and M. M. Muhammed "(-201) β-Gallium oxide substrate for high quality GaN materials", Proc. SPIE 9364, Oxide-based Materials and Devices VI, 93641K (13 March 2015); https://doi.org/10.1117/12.2076475
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Cited by 3 scholarly publications.
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KEYWORDS
Gallium nitride

Raman spectroscopy

Metalorganic chemical vapor deposition

Luminescence

Sapphire

Oxides

Picosecond phenomena

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