Ion implantation in silicon to facilitate testing of photonic circuits

Graham T. Reed; Milan M. Milosevic; Xia Chen; Wei Cao; Callum G. Littlejohns; Hong Wang; Ali Z. Khokhar; David J. Thomson

doi:10.1117/12.2252770

20 February 2017 Ion implantation in silicon to facilitate testing of photonic circuits

Graham T. Reed, Milan M. Milosevic, Xia Chen, Wei Cao, Callum G. Littlejohns, Hong Wang, Ali Z. Khokhar, David J. Thomson

Author Affiliations +

Proceedings Volume 10107, Smart Photonic and Optoelectronic Integrated Circuits XIX; 1010709 (2017) https://doi.org/10.1117/12.2252770
Event: SPIE OPTO, 2017, San Francisco, California, United States

Abstract

In recent years, we have presented results on the development of erasable gratings in silicon to facilitate wafer scale testing of photonics circuits via ion implantation of germanium. Similar technology can be employed to develop a range of optical devices that are reported in this paper. Ion implantation into silicon causes radiation damage resulting in a refractive index increase, and can therefore form the basis of multiple optical devices. We demonstrate the principle of a series of devices for wafers scale testing and have also implemented the ion implantation based refractive index change in integrated photonics devices for device trimming.

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Citation Download Citation

Graham T. Reed, Milan M. Milosevic, Xia Chen, Wei Cao, Callum G. Littlejohns, Hong Wang, Ali Z. Khokhar, and David J. Thomson "Ion implantation in silicon to facilitate testing of photonic circuits", Proc. SPIE 10107, Smart Photonic and Optoelectronic Integrated Circuits XIX, 1010709 (20 February 2017); https://doi.org/10.1117/12.2252770

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