Paper
16 October 1998 Fast position and time-resolved read-out of micro-channelplates with the delay-line technique for single-particle and photon-detection
Ottmar Jagutzki, Volker Mergel, Klaus Ullmann-Pfleger, Lutz Spielberger, Ullrich Meyer, Reinhard Doerner, Horst W. Schmidt-Boecking
Author Affiliations +
Abstract
Based on delay-line read-out methods of micro-channelplate (MCP) stacks we develop imaging system for single particle and photon spectroscopy. A complete system consists of an open MCP-detector with helical wire anode, specially designed front-end electronics and a stand alone PC-based TDC-system. We achieve a position resolution better than 0.1 mm and excellent linearity for open dimensions up to 100 mm, multi-hit operation, and detection rates up to 20 kiloEvents/sec in an event-listing mode or over 1 MegaCount/sec in a histogram mode. Both modes allow 2D position and time-of-flight (TOF) spectroscopy with approximately 1 nanosec TOF resolution. Furthermore, we currently test a delay-line anode on printed circuit that operates with image charge pick-up from a high-resistive collecting anode. With an image charge detection method this 3D-imaging technique can be applied to commercial sealed MCP single-photon detectors. While a simple high-resistive collection anode is placed inside the tube, a position sensitive pick-up electrode can be mounted next to it outside the vacuum wall.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ottmar Jagutzki, Volker Mergel, Klaus Ullmann-Pfleger, Lutz Spielberger, Ullrich Meyer, Reinhard Doerner, and Horst W. Schmidt-Boecking "Fast position and time-resolved read-out of micro-channelplates with the delay-line technique for single-particle and photon-detection", Proc. SPIE 3438, Imaging Spectrometry IV, (16 October 1998); https://doi.org/10.1117/12.328113
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CITATIONS
Cited by 50 scholarly publications and 2 patents.
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KEYWORDS
Sensors

Microchannel plates

Electronics

Particles

Imaging systems

Electrons

Spectroscopy

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