Sensitivity of x-ray phase tomography based on Talbot and Talbot-Lau interferometer

Atsushi Momose; Wataru Yashiro; Yoshihiro Takeda; Norihide Maikusa

doi:10.1117/12.792953

17 September 2008 Sensitivity of x-ray phase tomography based on Talbot and Talbot-Lau interferometer

Atsushi Momose, Wataru Yashiro, Yoshihiro Takeda, Norihide Maikusa

Proceedings Volume 7078, Developments in X-Ray Tomography VI; 707811 (2008) https://doi.org/10.1117/12.792953
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

The sensitivity of X-ray phase tomography based on Talbot(-Lau) interferometry is discussed. A criterion is described to evaluate the superiority of the technique in comparison to the conventional absorption-contrast method. An experimental result of X-ray phase tomography with a Talbot interferometer is compared with the criterion. The advantage of X-ray phase tomography based on Talbot(-Lau) interferometry is more prominent when smaller structures are observed with smaller pixels.

Citation Download Citation

Atsushi Momose, Wataru Yashiro, Yoshihiro Takeda, and Norihide Maikusa "Sensitivity of x-ray phase tomography based on Talbot and Talbot-Lau interferometer", Proc. SPIE 7078, Developments in X-Ray Tomography VI, 707811 (17 September 2008); https://doi.org/10.1117/12.792953

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