Abdalla S. Harmoul Al Ali
Opto-Mechanical Engineer at EIAST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 July 2016 Paper
Edward Wishnow, Tim Miller, Matthew Fillingim, Jerry Edelstein, Robert Lillis, Eric Korpela, Scott England, William Van Shourt, Oswald Siegmund, Jason McPhate, Sasha Courtade, David Curtis, Justin Deighan, Michael Chaffin, Abdullah Harmoul, Hessa Al Matroushi
Proceedings Volume 9905, 990538 (2016) https://doi.org/10.1117/12.2233512
KEYWORDS: Ultraviolet radiation, Edge roughness, Sensors, Reflectivity, Reflection, Platinum, Charge-coupled devices, Ultraviolet coatings, CCD image sensors, Optical filters

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