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Andrey P. Skorobogatov
at Scientific Research Institute for System Analysis
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Publications (1)
Proceedings Article | 30 December 2016 Paper
Application of triple modular redundancy for soft error mitigation in 65-28 nm CMOS VLSI
Proceedings Volume 10224, 1022417 (2016) https://doi.org/10.1117/12.2267143
KEYWORDS: Very large scale integration, Ions, Metals, Error analysis, Logic, Failure analysis, Particles, Standards development, Monte Carlo methods, Clocks
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