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Don Freschi
CEO at Fenix Advanced Materials Inc
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Publications (1)
Proceedings Article | 13 July 1994 Paper
Substrate-quality ternary III-V single crystals for II-VI device applications: growth and characterization
William Bonner, Brian Lent, Donald Freschi, W. Hoke
Proceedings Volume 2228, (1994) https://doi.org/10.1117/12.179681
KEYWORDS: Crystals, Single crystal X-ray diffraction, Liquids, Liquid crystals, Gallium, Indium, Compound semiconductors, Semiconducting wafers, Temperature metrology, Luminescence
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