Esther van Duijn
at Rijksmuseum
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 August 2023 Presentation + Paper
Proceedings Volume 12620, 126200A (2023) https://doi.org/10.1117/12.2673263
KEYWORDS: Inspection, Shearography, Cameras, Equipment, Deformation, 3D image processing, Cultural heritage, Optical metrology

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