Fei Shen
at National Institute of Metrology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 March 2015 Paper
Yushu Shi, Xu Song, Shi Li, Wei Li, Qi Li, Siwen Chen, Fei Shen, Xiaoping Song, Sitian Gao
Proceedings Volume 9446, 944637 (2015) https://doi.org/10.1117/12.2181284
KEYWORDS: Calibration, Optical spheres, Printed circuit board testing, Standards development, X-rays, Sensors, Metrology, X-ray computed tomography, X-ray sources, 3D metrology

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