Fenfen Lin
at Huazhong Univ of Science and technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 March 2015 Paper
Fenfen Lin, Shuling Zhao, Suping Chang, Yanling Sun, Tiebang Xie
Proceedings Volume 9446, 94463N (2015) https://doi.org/10.1117/12.2181402
KEYWORDS: Confocal microscopy, Optical testing, Sensors, Beam splitters, Image resolution, Microscopy, Charge-coupled devices, CCD image sensors, Optical scanning systems, Optical microscopy

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