Forrest R. Ruhge
at Siemens AG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 August 2004 Paper
Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.542210
KEYWORDS: Diffusion, Copper, Gallium arsenide, Optical filters, Absorption, Absorption filters, Infrared radiation, Polishing, Spectroscopy, Surface finishing

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