Hamza Özer
at TUBITAK-UEKAE
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 June 2003 Paper
Proceedings Volume 5020, (2003) https://doi.org/10.1117/12.477313
KEYWORDS: Distortion, Steganalysis, Signal to noise ratio, Distance measurement, Quality measurement, Digital watermarking, Feature selection, Data hiding, Scanning probe microscopy, Surface plasmons

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